International Journal of Applied Electromagnetics and Mechanics
IMPACT FACTOR: 0,328 (JCR '10)
Volume 35-37; 12 issues
Institutional subscription (print and online) for 2011: €1114 / US$1540 (including postage and handling)
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Status Report: Last issue (volume 36:1-2) online on 8 June 2011
Next issue (volume 36:3) scheduled for July 2011
Aims and Scope
Submission of Manuscripts
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Founding EditorK. Miya
Advanced Systems Evaluation Laboratory
Institute of Fluid Science
Katahira 2-1-1, Aoba-ku
Tel.: +81 22 217 5248 (+ Fax)
Regional EditorsG.A. Maugin
Laboratoire de Modelisation en Mecanique
Université Pierre et Marie Curie, Case 162
4, Place Jussieu
75252 Paris Cedex 05
Satish S. Udpa
College of Engineering
Michigan State University
3410 Engineering Building
East Lansing, MI 48824
instructions to authors.
- Physics and mechanics of electromagnetic materials and devices;
- Computational electromagnetic in materials and devices;
- Applications of electromagnetic fields and forces.
The three interrelated key subjects - materials, electromagnetics and mechanics - include the following aspects: control, micromachines, intelligent structure, inverse problem, eddy current analysis, electromagnetic NDE, magnetic materials, magnetoelastic effects in materials, bioelectromagnetics, magnetosolid mechanics, magnetic levitations, applied physics of superconductors, superconducting magnet technology, superconducting propulsion system, nuclear fusion reactor components and wave propagation in electromagnetic fields.
The editorial policy is to combine information and experience from both the latest high technology fields and the well-established technologies within applied electromagnetics and mechanics.
The editors hope to furtherly enhance the theoretical framework for our field from the interaction of old and new concepts. In order to assist readers to quickly grasp the current status of research in a specific area of applied electromagnetics and mechanics, both contributed and invited papers are published in special and thematic issues as well as regular issues.
Abstracted inCPX, EBSCO database, Journal Citation Reports/Science Edition, Materials Science Citation Index®, Science Citation Index-Expanded (SciSearch®), ulrich's periodicals