Information Modelling and Knowledge Bases XXXII

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Editors
Tropmann-Frick, M., Thalheim, B., Jaakkola, H., Kiyoki, Y., Yoshida, N.
Pub. date
January 2021
Pages
368
Binding
softcover
Volume
333 of Frontiers in Artificial Intelligence and Applications
ISBN print
978-1-64368-140-5
ISBN online
978-1-64368-141-2
Subject
Computer Science
 
This book contains a subject index
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Information modeling and knowledge bases are important technologies for academic and industrial research that goes beyond the traditional borders of information systems and computer science. The amount and complexity of information to be dealt with grows continually, as do the levels of abstraction and the size of databases.

This book presents the proceedings of the 30th International Conference on Information Modelling and Knowledge Bases (EJC2020), due to be held in Hamburg, Germany on 8 and 9 June 2020, but instead held as a virtual conference on the same dates due to the Corona-virus pandemic restrictions. The conference provides a research forum for the exchange of scientific results and experiences, and brings together experts from different areas of computer science and other disciplines with a common interest in information modeling and knowledge bases. The subject touches on many disciplines, with philosophy and logic, cognitive science, knowledge management, linguistics and management science, as well as the emerging fields of data science and machine learning, all being relevant areas. The 23 reviewed, selected, and upgraded contributions included here are the result of presentations, comments, and discussions from the conference, and reflect the themes of the conference sessions: learning and linguistics; systems and processes; data and knowledge representation; models and interfaces; formalizations and reasoning; models and modeling; machine learning; models and programming; environment and predictions; modeling emotion; and social networks.

The book provides an overview of current research and applications, and will be of interest to all those working in the field.